Real-time system diagnosis with sensors of uncertain quality

Real-time system diagnosis with sensors of uncertain quality

Author(s):

Erdinc, O. ( Univ. of Connecticut (USA) )
Raghavendra, C. ( Univ. of Connecticut (USA) )
Willett, P.K. ( Univ. of Connecticut (USA) )
Kirubarajan, T. ( McMaster Univ. (Canada) )

Publication title:

System Diagnosis and Prognosis: Security and Condition Monitoring Issues III

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5107

Pub. Year:

2003

Page(from):

129

Page(to):

140

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449672 [0819449679]

Language:

English

Call no.:

P63600/5107

Type:

Conference Proceedings

Details

TDL ID:	ZA00013096
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : System Diagnosis and Prognosis
Conf. info. (Number):	2003 : 3rd
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2003.04.21

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