A cyber-event correlation framework and metrics

A cyber-event correlation framework and metrics

Author(s):

Kang, M.H. ( Mitretek Systems (USA) )
Mayfield, T. ( Institute for Defense Analyses (USA) )

Publication title:

System Diagnosis and Prognosis: Security and Condition Monitoring Issues III

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5107

Pub. Year:

2003

Page(from):

72

Page(to):

82

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449672 [0819449679]

Language:

English

Call no.:

P63600/5107

Type:

Conference Proceedings

Details

TDL ID:	ZA00013096
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : System Diagnosis and Prognosis
Conf. info. (Number):	2003 : 3rd
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2003.04.21

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