Maximizing performance of real-time CHAMP (RTC) for hardware-in-the-loop (HITL) testing

Maximizing performance of real-time CHAMP (RTC) for hardware-in-the-loop (HITL) testing

Author(s):

Lashley, T.C. ( BAE Systems (USA) )
Crow, D.R. ( Kinetics, Inc. (USA) )

Publication title:

Technologies for synthetic environments: Hardware-in-the-loop testing VIII : 21-22 April 2003, Oriando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5092

Pub. Year:

2003

Page(from):

7

Page(to):

14

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449528 [0819449520]

Language:

English

Call no.:

P63600/5092

Type:

Conference Proceedings

Details

TDL ID:	ZA00013081
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Technologies for Synthetic Environments: Hardware-in-the-Loop Testing
Conf. info. (Number):	2003 : 8th
Conf. info. (Venue):	Oriando, FL, USA
Conf. info. (Date):	2003.04.21-2003.04.22

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