Development of Si:As impurity band conduction (IBC) detectors for mid-infrared applications
- Author(s):
Ando, K.J. ( Raytheon Vision Systems (USA) ) Hoffman, A.W. ( Raytheon Vision Systems (USA) ) Love, P.J. ( Raytheon Vision Systems (USA) ) Toth, A. ( Raytheon Vision Systems (USA) ) Anderson, C. ( Raytheon Vision Systems (USA) ) Chapman, G. ( Raytheon Vision Systems (USA) ) McCreight, C.R. ( NASA Ames Research Ctr. (USA) ) Ennico, K.A. ( NASA Ames Research Ctr. (USA) ) McKelvey, M.E. ( NASA Ames Research Ctr. (USA) ) McMurray, R.E. Jr., ( NASA Ames Research Ctr. (USA) ) - Publication title:
- Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5074
- Pub. Year:
- 2003
- Page(from):
- 648
- Page(to):
- 657
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449337 [0819449334]
- Language:
- English
- Call no.:
- P63600/5074
- Type:
- Conference Proceedings
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