Resolution and sensitivity improvements for VOx microbolometer FPAs

Resolution and sensitivity improvements for VOx microbolometer FPAs

Author(s):

Murphy, D.F. ( Raytheon Vision Systems (USA) )

Kennedy, A. ( Raytheon Vision Systems (USA) )

Ray, M. ( Raytheon Vision Systems (USA) )

Wyles, R. ( Raytheon Vision Systems (USA) )

Wyles, J. ( Raytheon Vision Systems (USA) )

Asbrock, J.F. ( Raytheon Vision Systems (USA) )

Hewitt, C. ( Raytheon Vision Systems (USA) )

Lue, D.V. ( Raytheon Vision Systems (USA) )

Sessler, T. ( Raytheon Vision Systems (USA) )

Anderson, J.S. ( Raytheon Space and Airborne Systems (USA) )

Bradley, D. ( Raytheon Space and Airborne Systems (USA) )

Chin, R. ( Raytheon Space and Airborne Systems (USA) )

Gonzales, H. ( Raytheon Space and Airborne Systems (USA) )

Pere, C.L. ( Raytheon Space and Airborne Systems (USA) )

Kostrzewa, T. ( Raytheon Space and Airborne Systems (USA) )

10 more

Publication title:

Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5074

Pub. Year:

2003

Page(from):

402

Page(to):

413

Pages:

12

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449337 [0819449334]

Language:

English

Call no.:

P63600/5074

Type:

Conference Proceedings

Details

TDL ID:	ZA00013062
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Infrared Technology and Applications
Conf. info. (Number):	2003 : 29th
Conf. info. (Venue):	Oriando, FL, USA
Conf. info. (Date):	2003.04.21-2003.04.25

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