High-resolution extended NIR camera
- Author(s):
Cabelli, S.A. ( Rockwell Scientific Co. (USA) ) Pan, J. ( Rockwell Scientific Co. (USA) ) Bernd, S.G. ( Rockwell Scientific Co. (USA) ) Tennant, W.E. ( Rockwell Scientific Co. (USA) ) Blackwell, J.D. ( Rockwell Scientific Co. (USA) ) Bhargava, S. ( Rockwell Scientific Co. (USA) ) Pasko, J.G. ( Rockwell Scientific Co. (USA) ) Piquette, E.C. ( Rockwell Scientific Co. (USA) ) Edwall, D.D. ( Rockwell Scientific Co. (USA) ) - Publication title:
- Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5074
- Pub. Year:
- 2003
- Page(from):
- 343
- Page(to):
- 352
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449337 [0819449334]
- Language:
- English
- Call no.:
- P63600/5074
- Type:
- Conference Proceedings
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