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Characterization and analysis of InGaAsSb detectors

Author(s):
Abedin, M.N. ( NASA Langley Research Ctr. (USA) )
Refaat, T.F. ( Science and Technology Corp. (USA) )
Joshi, R.P. ( Old Dominion Univ. (USA) )
Sulima, O.V. ( AstroPower, Inc. (USA) )
Mauk, M.G. ( AstroPower, Inc. (USA) )
Singh, U.N. ( NASA Langley Research Ctr. (USA) )
1 more
Publication title:
Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5074
Pub. Year:
2003
Page(from):
332
Page(to):
342
Pages:
11
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449337 [0819449334]
Language:
English
Call no.:
P63600/5074
Type:
Conference Proceedings

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