Study on the near-field recording spot
- Author(s):
- Pei, X. ( Huazhong Univ. of Science and Technology (China) )
- Xia, Y. ( Huazhong Univ. of Science and Technology (China) )
- Huang, H. ( Huazhong Univ. of Science and Technology (China) )
- Xie, C. ( Huazhong Univ. of Science and Technology (China) )
- Wang, H. ( Huazhong Univ. of Science and Technology (China) )
- Publication title:
- Sixth International Symposium on Optical Storage (ISOS 2002)
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5060
- Pub. Year:
- 2003
- Page(from):
- 304
- Page(to):
- 307
- Pages:
- 4
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448668 [0819448664]
- Language:
- English
- Call no.:
- P63600/5060
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Radial dynamical characteristic analysis and measurement for optical drivers
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Properties of active waveguide of ultrasmall-size laser used in near-field optical recording:characterization and model
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Optical head flying height-variation-based statistical recording density analysis in near-field optical recording
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
The research about high-speed optical recording wave and optimum power parameter model
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Study of field distribution of the probes in scanning near-field optical microscopy using finite-difference time-domain calculations
SPIE - The International Society for Optical Engineering |