Thermal measurement and analysis of micro devices using thermography

Thermal measurement and analysis of micro devices using thermography

Author(s):

Gu, Y.Q. ( Tsinghua Univ. (China) )
Zhang, R.H. ( Tsinghua Univ. (China) )
Zhu, D.Z. ( Tsinghua Univ. (China) )

Publication title:

Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5058

Pub. Year:

2003

Page(from):

502

Page(to):

510

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448644 [0819448648]

Language:

English

Call no.:

P63600/5058

Type:

Conference Proceedings

Details

TDL ID:	ZA00013049
Series ID:	PA00000029
Conf. info. (Name):	Optical Technology and Image Processing for Fluids and Solids Diagnostics
Conf. info. (Number):	2002
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2002.09.03-2002.09.06

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