Application of frequency domain ARX models and extreme value statistics to damage detection

Application of frequency domain ARX models and extreme value statistics to damage detection

Author(s):

Fasel, T.R. ( Los Alamos National Lab. (USA) )
Sohn, H. ( Los Alamos National Lab. (USA) )
Farrar, C.R. ( Los Alamos National Lab. (USA) )

Publication title:

Smart structures and materials 2003 : Smart systems and nondestructive evaluation for civil infrastructures : 3-6 March 2003, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5057

Pub. Year:

2003

Page(from):

145

Page(to):

156

Pages:

12

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448620 [0819448621]

Language:

English

Call no.:

P63600/5057

Type:

Conference Proceedings

Details

TDL ID:	ZA00013048
Series ID:	PA00000029
Conf. info. (Name):	Smart Structures and Materials
Conf. info. (Number):	2003
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.03.03-2003.03.06

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