Blank Cover Image

Dependency of electric field and mechanical stress on piezoelectric strain of PZT 3203HD

Author(s):
Publication title:
Smart structures and materials 2003 : Active materials : Behavior and mechanics : 3-6 March 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5053
Pub. Year:
2003
Page(from):
498
Page(to):
504
Pages:
7
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448583 [0819448583]
Language:
English
Call no.:
P63600/5053
Type:
Conference Proceedings

Similar Items:

Park,H.C., Lee,S., Cho,B.C., Yoon,K.J., Goo,N.S.

SPIE-The International Society for Optical Engineering

Sherrit,S., Wiederick,H.D., Mukherjee,B.K.

SPIE-The International Society for Optical Engineering

Lee, S.K., Park, H.C., Park, K.H., Yoon, K.J., Cho, C.

SPIE-The International Society for Optical Engineering

Yoon,K.J., Chung,J.H., Goo,N.S., Park,H.C.

SPIE-The International Society for Optical Engineering

Park, K.H., Kim, Y.B., Kim, Y.S., Park, H.C., Yoon, K.J.

SPIE-The International Society for Optical Engineering

Won, S.H., Lee, C. B., Nam, H.C., Hur, J.H., Jang, J.

Electrochemical Society

Sherrit,S., Wiederick,H.D., Mukherjee,B.K., Sayer,M.

SPIE-The International Society for Optical Engineering

Park, H.C., Lee, S.Y., Lim, S.M., Lee, S.K., Yoon, K.J., Goo, N.S.

SPIE - The International Society of Optical Engineering

Park, H.C., Kim, K.J., Lee, S.K., Chah, Y.J.

SPIE - The International Society of Optical Engineering

Yoon,K.J., Shin,S., Kim,J., Park,H.C., Kwak,M.K.

SPIE - The International Society for Optical Engineering

S.C. Ur, Y.G. Choi, J.C. Kwon, S.L. Ryu, Y.G. Lee, J.L. Lee, L.H. Kim, T.W. Hong, S.Y. Kwon, M.S. Yoon

Trans Tech Publications

Goo,N.S., Kim,C., Park,H.C., Yoon,K.J.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12