Blank Cover Image

Micro- and nano-NDE systems for aircraft: great things in small packages (Invited Paper)

Author(s):
Malas, J.C. ( Air Force Research Lab. (USA) )
Kropas-Hughes, C.V. ( Air Force Research Lab. (USA) )
Blackshire, J.L. ( Air Force Research Lab. (USA) )
Moran, T. ( Air Force Research Lab. (USA) )
Peeler, D. ( Air Force Research Lab. (USA) )
Frazier, W.G. ( Miltec Research and Technology Inc. (USA) )
Parker, D. ( Miltec Research and Technology, Inc. (USA) )
2 more
Publication title:
Testing, Reliability, and Application of Micro- and Nano-Material Systems
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5045
Pub. Year:
2003
Page(from):
28
Page(to):
36
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448507 [0819448508]
Language:
English
Call no.:
P63600/5045
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Microscopic NDE of hidden corrosion

Blackshire, J.L., Hoffmann, J., Kropas-Hughes, C.V., Tansel, I.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Packaged high-speed electro-optic polymer modulators (Invited Paper) [6331-31]

Dinu, R., Jin, D., Huang, D., Koenig, M. K., Barklund, A. M., Fang, Y., Parker, T. C.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Comparative study of neural network damage detection from a statistical set of electro-mechanical impedance spectra

Giurgiutiu, V., Kropas-Hughes, C.V.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Electron-beam lithography for micro- and nano-optical applications (Invited Paper)

Wilson, D.W., Muller, R.E., Echternach, P.M., Backlund, J.P.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings X-ray microscopy for NDE of micro- and nano-structrues(Invited Paper)

Wang, S., Duewer, F., Feser, M., Scott, D., Yun, W.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings In situ measurements of stress-corrosion crack growth using laser ultrasonics

Kacmar, C., Blackshire, J.L.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Noncontact NDE of microscopic surface-breaking cracks using laser generated and detected ultrasonic surface waves

Cooney, A., Blackshire, J.L.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Laser processing of micro-cracks for structural life extension

Blackshire, J.L., Dosser, L., Hix, K.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Microsystem packaging in 3D (Invited Paper)

Kelly,G., Alderman,J.C., Lyden,C., Barrett,J., Morrissey,A.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Teaching optics in the laboratory(Invited Paper)

Dainty,J.C.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Femtosecond pulse damage and predamate behavior of dielectric thin films (Invited Paper)

Mero, M., Liu, J., Sabbah, A., Jasapara, J.C., Starke, K., Ristau, D., McIver, J.K., Rudolph, W.G.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Advances in interferometric metrology (Invited Paper)

Wyant, J.C.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12