Blank Cover Image

Optimal model-predictive control of overlay lithography implemented in an ASIC fab

Author(s):
Middlebrooks, S.A. ( LSI Logic Corp. (USA) )  
Publication title:
Advanced process control and automation : 27 February, 2003, Santa Clara, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5044
Pub. Year:
2003
Page(from):
12
Page(to):
23
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448491 [0819448494]
Language:
English
Call no.:
P63600/5044
Type:
Conference Proceedings

Similar Items:

Zavyalova, L., Fu, C.-C., Seligman, G.S., Tapp, P.A., Pol, V.

SPIE-The International Society for Optical Engineering

Reu, P.L., Chen, C.-F., Engelstad, R.L., Lovell, E.G., Lercel, M.J., Wood, O.R., II, Mackay, R.S.

SPIE-The International Society for Optical Engineering

8 Conference Proceedings Measuring fab overlay programs

Richard J. Martin, Xuemei Chen, Itzik Goldberger

SPIE - The International Society of Optical Engineering

Tyminski,J.K., McNamara,S.J., Meisner,S.A., Gorham,R.R.

SPIE-The International Society for Optical Engineering

MC DONALD, K., MC AVOY, T. J.

American Institute of Chemical Engineers

A. B. Kahng, S. V. Muddu

Society of Photo-optical Instrumentation Engineers

Seltmann,R., Demmerle,W., Staples,M., Minvielle,A.M., Schulz,B., Muehle,S.

SPIE - The International Society for Optical Engineering

Zuo, L., Nayfeh, S.A.

SPIE - The International Society of Optical Engineering

W. Luo, S. Pan, Z. Ma, H. Lan

Society of Photo-optical Instrumentation Engineers

12 Conference Proceedings Topics in Model Predictive Control

Meadows S. E., Rawlings B. J.

Kluwer Academic Publishers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12