Development status of a 157-nm full-field scanner
- Author(s):
Nakano, H. ( Canon Inc. (Japan) ) Hata, H. ( Canon Inc. (Japan) ) Nogawa, H. ( Canon Inc. (Japan) ) Deguchi, N. ( Canon Inc. (Japan) ) Kohno, M. ( Canon Inc. (Japan) ) Chiba, Y. ( Canon Inc. (Japan) ) - Publication title:
- Optical Microlithography XVI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5040
- Pub. Year:
- 2003
- Vol.:
- Part Two
- Page(from):
- 763
- Page(to):
- 771
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448453 [0819448451]
- Language:
- English
- Call no.:
- P63600/5040
- Type:
- Conference Proceedings
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