Water immersion optical lithography for 45-nm node
- Author(s):
- Smith, B.W. ( Rochester Institute of Technology (USA) )
- Kang, H. ( Rochester Institute of Technology (USA) )
- Bourov, A. ( Rochester Institute of Technology (USA) )
- Cropanese, F. ( Rochester Institute of Technology (USA) )
- Fan, Y. ( Rochester Institute of Technology (USA) )
- Publication title:
- Optical Microlithography XVI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5040
- Pub. Year:
- 2003
- Vol.:
- Part Two
- Page(from):
- 679
- Page(to):
- 689
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448453 [0819448451]
- Language:
- English
- Call no.:
- P63600/5040
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Approaching the numerical aperture of water immersion lithography at 193-nm
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Resist process window characterization for the 45-nm node using an interferometric immersion microstepper [6153-27]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
6
Conference Proceedings
Study of air-bubble-induced light scattering effect on image quality in 193-nm immersion lithography
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |