Highly etch-selective spin-on bottom antireflective coating for use in 193-nm lithography and beyond
- Author(s):
Pfeiffer, D. ( IBM Thomas J. Watson Research Ctr. (USA) ) Mahorowala, A.P. ( IBM Thomas J. Watson Research Ctr. (USA) ) Babich, K. ( IBM Thomas J. Watson Research Ctr. (USA) ) Medeiros, D.R. ( IBM Thomas J. Watson Research Ctr. (USA) ) Petrillo, K.E. ( IBM Thomas J. Watson Research Ctr. (USA) ) Angelopoulos, M. ( IBM Thomas J. Watson Research Ctr. (USA) ) Huang, W.-S. ( IBM Microelectronics Div. (USA) ) Halle, S. ( IBM Microelectronics Div. (USA) ) Brodsky, C. ( IBM Microelectronics Div. (USA) ) Allen, S.D. ( IBM Microelectronics Div. (USA) ) Holmes, S.J. ( IBM Microelectronics Div. (USA) ) Kwong, R.W. ( IBM Microelectronics Div. (USA) ) Lang, R. ( IBM Microelectronics Div. (USA) ) Brock, P.J. ( IBM Almaden Research Ctr. (USA) ) - Publication title:
- Advances in Resist Technology and Processing XX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5039
- Pub. Year:
- 2003
- Vol.:
- 1
- Pt.:
- Session 4
- Page(from):
- 136
- Page(to):
- 143
- Pages:
- 8
- Pub. info.:
- Bellingham, CA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448446 [0819448443]
- Language:
- English
- Call no.:
- P63600/5039
- Type:
- Conference Proceedings
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