Making carbon nanotube probes for high aspect ratio scanning probe metrology
- Author(s):
Emirov, Y.N. ( Univ. of South Florida (USA) ) Beerbom, M. ( Univ. of South Florida (USA) ) Walters, D.A. ( Univ. of Central Florida (USA) ) Ren, Z.F. ( Boston College (USA) ) Huang, Z.P. ( NanoLab, Inc. (USA) ) Rossie, B.B. ( Univ. of South Florida (USA) ) Schlaf, R. ( Univ. of South Florida (USA) ) - Publication title:
- Metrology, Inspection, and Process Control for Microlithography XVII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5038
- Pub. Year:
- 2003
- Vol.:
- 1
- Page(from):
- 493
- Page(to):
- 495
- Pages:
- 3
- Pub. info.:
- Bellingham, WA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448439 [0819448435]
- Language:
- English
- Call no.:
- P63600/5038
- Type:
- Conference Proceedings
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