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Real-time interferometric investigation of defects and stresses in solids

Author(s):
Publication title:
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5024
Pub. Year:
2003
Page(from):
191
Page(to):
197
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448255 [0819448257]
Language:
English
Call no.:
P63600/5024
Type:
Conference Proceedings

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