Optical diagnostics of InGaAs quantum well in pseudomorphic modulation-doped Al1-xGaxAs/InyGa1-yAs/GaAs heterostructures of less-than-critical layer thickness

Optical diagnostics of InGaAs quantum well in pseudomorphic modulation-doped Al1-xGaxAs/InyGa1-yAs/GaAs heterostructures of less-than-critical layer thickness

Author(s):

Tarasov, G.G. ( Institute of Semiconductor Physics (Ukraine) )

Lavorik, S.R. ( Institute of Semiconductor Physics (Ukraine) )

Mazur, Yu.I. ( Institute of Semiconductor Physics (Ukraine) )

Valakh, M.Y. ( Institute of Semiconductor Physics (Ukraine) )

Zhuchenko, Z.Ya. ( Institute of Semiconductor Physics (Ukraine) )

Kissel, H. ( Humboldt-Univ. zu Berlin (Germany) )

Masselink, W.T. ( Humboldt-Univ. zu Berlin (Germany) )

Mueller, U. ( Humboldt-Univ. zu Berlin (Germany) )

Walther, C. ( Humboldt-Univ. zu Berlin (Germany) )

4 more

Publication title:

Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5024

Pub. Year:

2003

Page(from):

137

Page(to):

144

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448255 [0819448257]

Language:

English

Call no.:

P63600/5024

Type:

Conference Proceedings

Details

TDL ID:	ZA00013008
Series ID:	PA00000029
Conf. info. (Name):	Optics and Photonics

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