Improved Vector Error Diffusion for Reduction of Smear Artifact in the Boundary Regions

Improved Vector Error Diffusion for Reduction of Smear Artifact in the Boundary Regions

Author(s):

Lee, S.-C. ( Kyungpook National Univ. (South Korea) )
Kim, Y.-T. ( Kyungpook National Univ. (South Korea) )
Cho, Y.-H. ( Kyungpook National Univ. (South Korea) )
Ha, Y.-H. ( Kyungpook National Univ. (South Korea) )

Publication title:

Color imaging VIII : processing, hardcopy, and applications : 21-24 January 2003, Santa Clara, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5008

Pub. Year:

2003

Page(from):

467

Page(to):

474

Pages:

8

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448088 [0819448087]

Language:

English

Call no.:

P63600/5008

Type:

Conference Proceedings

Details

TDL ID:	ZA00012991
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Color imaging
Conf. info. (Number):	2003 : 8th
Conf. info. (Venue):	Santa Clara, CA, USA
Conf. info. (Date):	2003.01.21-2003.01.24

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