New constraint on spectral reflectance and its application in illuminant detection

New constraint on spectral reflectance and its application in illuminant detection

Author(s):

Jiang, X. ( Rochester Institute of Technology (USA) )
Fairchild, M.D. ( Rochester Institute of Technology (USA) )

Publication title:

Color imaging VIII : processing, hardcopy, and applications : 21-24 January 2003, Santa Clara, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5008

Pub. Year:

2003

Page(from):

186

Page(to):

196

Pages:

11

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448088 [0819448087]

Language:

English

Call no.:

P63600/5008

Type:

Conference Proceedings

Details

TDL ID:	ZA00012991
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Color imaging
Conf. info. (Number):	2003 : 8th
Conf. info. (Venue):	Santa Clara, CA, USA
Conf. info. (Date):	2003.01.21-2003.01.24

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