Direct probing of local-density-of-states in semiconductor nanostructures (Invited Paper)

Direct probing of local-density-of-states in semiconductor nanostructures (Invited Paper)

Author(s):

Kanisawa, K. ( NTT Corp. (Japan) )
Tokura, Y. ( NTT Corp. (Japan) )
Yamaguchi, H. ( NTT Corp. (Japan) )
Hirayama, Y. ( NTT Corp. (Japan) )

Publication title:

Quantum Sensing: Evolution and Revolution from Past to Future

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4999

Pub. Year:

2003

Page(from):

379

Page(to):

386

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447999 [0819447994]

Language:

English

Call no.:

P63600/4999

Type:

Conference Proceedings

Details

TDL ID:	ZA00012982
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Quantum sensing
Conf. info. (Number):	2003
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2003.01.27-2003.01.30

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