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Reliability and failure mechanisms of oxide VCSELs in non-hermetic enviroments

Author(s):
Xie, S. ( Agilent Technologies, Inc. (USA) )
Herrick, R.W. ( Agilent Technologies, Inc. (USA) )
Brabander, G.N.D. ( Agilent Technologies, Inc. (USA) )
Widjaja, W.H. ( Agilent Technologies, Inc. (USA) )
Koelle, U. ( Agilent Technologies, Inc. (USA) )
Cheng, A.-N. ( Agilent Technologies, Inc. (USA) )
Giovane, L.M. ( Agilent Technologies, Inc. (USA) )
Hu, F.Z. ( Agilent Technologies, Inc. (USA) )
Keever, M.R. ( Agilent Technologies, Inc. (USA) )
Osentowski, T. ( Agilent Technologies, Inc. (USA) )
McHugo, S.A. ( Agilent Technologies, Inc. (USA) )
Mayonte, M.S. ( Agilent Technologies, Inc. (USA) )
Kim, S.M. ( Agilent Technologies, Inc. (USA) )
Chamberlin, D.R. ( Agilent Technologies, Inc. (USA) )
Rosner, S.J. ( Agilent Technologies, Inc. (USA) )
Girolami, G. ( Agilent Technologies, Inc. (USA) )
11 more
Publication title:
Vertical-Cavity Surface-Emitting Lasers VII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4994
Pub. Year:
2003
Page(from):
173
Page(to):
180
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447944 [0819447943]
Language:
English
Call no.:
P63600/4994
Type:
Conference Proceedings

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