Nanoscale materials characterization of degradation in VCSELs (Invited Paper)
- Author(s):
Mathes, D.T. ( Honeywell Inc. (USA) ) Hull, R. ( Univ. of Virginia (USA) ) Choquette, K.D. ( Univ. of Illinois/Urbana-Champaign (USA) ) Geib, K.M. ( Sandia National Labs. (USA) ) Allerman, A.A. ( Sandia National Labs. (USA) ) Guenter, J.K. ( Honeywell Inc. (USA) ) Hawkins, B. ( Honeywell Inc. (USA) ) Hawthorne, R.A. ( Honeywell Inc. (USA) ) - Publication title:
- Vertical-Cavity Surface-Emitting Lasers VII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4994
- Pub. Year:
- 2003
- Page(from):
- 67
- Page(to):
- 82
- Pages:
- 16
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447944 [0819447943]
- Language:
- English
- Call no.:
- P63600/4994
- Type:
- Conference Proceedings
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