Reliability and qualification of an integrated MEMS attenuator for optical component applications
- Author(s):
Hickey, R. ( Nortel Networks (Canada) ) Fettig, H. ( Nortel Networks (Canada) ) Wylde, J. ( Nortel Networks (Canada) ) Legros, S.J. ( Nortel Networks (Canada) ) Mallard, R.E. ( Nortel Networks (Canada) ) Nentwich, H. ( Nortel Networks (Canada) ) Hart, C. ( Nortel Networks (Canada) ) - Publication title:
- Reliability, Testing, and Characterization of MEMS/MOEMS II
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4980
- Pub. Year:
- 2003
- Page(from):
- 309
- Page(to):
- 316
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447807 [0819447803]
- Language:
- English
- Call no.:
- P63600/4980
- Type:
- Conference Proceedings
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