Surface analysis by laser-induced desorption time-of-flight mass spectrometry

Surface analysis by laser-induced desorption time-of-flight mass spectrometry

Author(s):

Allen, S.D. ( Arkansas State Univ. (USA) )
Fu, J.M. ( Florida State Univ. (USA) )
Surapaneni, Y. ( Florida State Univ. (USA) )
Hopkins, A.J. ( Florida State Univ. (USA) )
Davis, P. ( Arkansas State Univ. (USA) )

Publication title:

Photon Processing in Microelectronics and Photonics II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4977

Pub. Year:

2003

Page(from):

1

Page(to):

9

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447777 [0819447773]

Language:

English

Call no.:

P63600/4977

Type:

Conference Proceedings

Details

TDL ID:	ZA00012961
Series ID:	PA00000029
Conf. info. (Name):	SPIE LASE : Photon processing in microelectronics and photonics
Conf. info. (Number):	2003 : 2nd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2003.01.27-2003.01.30

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