High-power diode array reliability experiment

High-power diode array reliability experiment

Author(s):

Gallant, D.J. ( Boeing Co. (USA) )
Boeckl, J. ( Air Force Research Lab. (USA) )

Publication title:

High-Power Diode Laser Technology and Applications

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4973

Pub. Year:

2003

Page(from):

136

Page(to):

141

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447739 [0819447730]

Language:

English

Call no.:

P63600/4973

Type:

Conference Proceedings

Details

TDL ID:	ZA00012957
Series ID:	PA00000029
Conf. info. (Name):	SPIE LASE : High-power diode laser technology and applications
Conf. info. (Number):	2003
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2003.01.27-2003.01.28

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