Diode laser-based diagnostic for NCl(X)

Diode laser-based diagnostic for NCl(X)

Author(s):

Davis, S.J. ( Physical Sciences, Inc. (USA) )
Mulhall, P.A. ( Physical Sciences Inc. (USA) )
Kessler, W.J. ( Physical Sciences Inc. (USA) )
Heaven, M.C. ( Emory Univ. (USA) )
Manke, G.C., II ( Air Force Research Lab. (USA) )

Publication title:

Gas and Chemical Lasers and Intense Beam Applications IV

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4971

Pub. Year:

2003

Page(from):

22

Page(to):

29

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447715 [0819447714]

Language:

English

Call no.:

P63600/4971

Type:

Conference Proceedings

Details

TDL ID:	ZA00012955
Series ID:	PA00000029
Conf. info. (Name):	SPIE LASE : Gas and chemical lasers and intense beam applications
Conf. info. (Number):	2003 : 4th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2003.01.28, 2003.01.30

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