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High-resolution three-dimensional imaging using multiple nanometric probes

Author(s):
  • Dubois, A. ( Ecole Superieure de Physique et Chimie Industrielles (France) )
  • Moneron, G. ( Ecole Superieure de Physique et Chimie Industrielles (France) )
  • Lecaque, R. ( Ecole Superieure de Physique et Chimie Industrielles (France) )
  • Lequeux, F. ( Ecole Superieure de Physique et Chimie Industrielles (France) )
  • Boccara, A.-C. ( Ecole Superieure de Physique et Chimie Industrielles (France) )
Publication title:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4964
Pub. Year:
2003
Page(from):
50
Page(to):
58
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819447647 [0819447641]
Language:
English
Call no.:
P63600/4964
Type:
Conference Proceedings

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