Simulation of spectral reflectance of multiple scattering medium using the Mie theory combined with the Monte Carlo method

Simulation of spectral reflectance of multiple scattering medium using the Mie theory combined with the Monte Carlo method

Author(s):

Igarashi, M. ( Tokyo Institute of Technology (Japan) )
Gono, K. ( Tokyo Institute of Technology (Japan) )
Obi, T. ( Tokyo Institute of Technology (Japan) )
Yamaguchi, M. ( Tokyo Institute of Technology (Japan) )
Ohyama, N. ( Tokyo Institute of Technology (Japan) )

Publication title:

Optical Tomography and Spectroscopy of Tissue V

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4955

Pub. Year:

2003

Page(from):

305

Page(to):

313

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819447555 [0819447552]

Language:

English

Call no.:

P63600/4955

Type:

Conference Proceedings

Details

TDL ID:	ZA00012939
Series ID:	PA00000029
Conf. info. (Name):	SPIE BiOS : Optical tomography and spectroscopy of tissue
Conf. info. (Number):	2003 : 5th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2003.01.26-2003.01.29

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