Reliability test procedures for tunable lasers(Invited Paper)

Author(s):

• Ciminelli, C. ( Politecnico di Bari (Italy) )
• Armenise, M.N. ( Politecnico di Bari (Italy) )
• Passaro, V.M.N. ( Politecnico di Bari (Italy) )

Publication title:

Integrated Optical Devices: Fabrication and Testing

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4944

Pub. Year:

2003

Page(from):

83

Page(to):

96

Pages:

14

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447395 [0819447390]

Language:

English

Call no.:

P63600/4944

Type:

Conference Proceedings