Blank Cover Image

Characterization of TiNi, TiNiPd thin films by ion beam analysis techniques

Author(s):
  • Mathe, V.K. ( RMIT Univ. (Australia) )
  • Sood, D.K. ( RMIT Univ. (Australia) )
  • Dytlewski, N. ( Australian Nuclear Science and Technology Organisation (Australia) )
  • Evans, P.J. ( Australian Nuclear Science and Technology Organisation (Australia) )
Publication title:
Nano- and Microtechnology: Materials, Processes, Packaging, and Systems
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4936
Pub. Year:
2002
Page(from):
403
Page(to):
413
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447319 [0819447315]
Language:
English
Call no.:
P63600/4936
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Laser patterning of thin films of TiNiPd deposited on silicon substrate

Mathe, V.K., Sood, D.K., Hayes, J.P.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Heavy Ion Recoil Time of Flight Method for Materials Analysis

Cohen,D., Dytlewski,N., Martin,J., Siegele,R.

Trans Tech Publications
2 Conference Proceedings Patterning of thin films of TiNi deposited on silicon substrate

Mathe, V.K., Sood, D.K., Hayes, J.P.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Ion Implantation Seeding of Electroplated Permalloy Films on Silicon

Ghantasala, M.K., Sood, D.K.

Electrochemical Society
3 Conference Proceedings A Novel Technique for the Characterization of Silicon Oxynitride Thin Films

Basa,D.K., Bose,M., Bose,D.N.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Ion Beam Techniques for Study of Diffusion

Avasthi,D.K., Tripathi,A.

Trans Tech Publications
4 Conference Proceedings THIN FILM INHOMOGENEITY CHARACTERIZATION BY ION BEAM TECHNIQUE

Capuj E. N., Arista R. N., Lantchsner H. G., Eckardt C. J., Jakes M. M.

Kluwer Academic Publishers
10 Conference Proceedings Characterization of distyrylbenzene derivative thin films vapor-deposlted on highly oriented poly(ρ-phenylenevinylene) friction-transferred layers

Ni,J.P., Ueda,Y., Yoshida,Y., Tanigaki,N., Yase,K., Wang,D.K.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings CHARACTERIZATION AND PERFORMANCE OF CARBON FILMS DEPOSITED BY PLASMA AND ION BEAM BASED TECHNIQUES

Walter, K. C., Kung, H., Levine, T., Tesmer, J. T., Kodali, P., Wood, B. P., Rej, D. J., Nastasi, M., Koskinen, J., …

MRS - Materials Research Society
11 Conference Proceedings ION BEAM-BASED CHARACTERIZATION OF MULTICOMPONENT OXIDE THIN FILMS AND THIN FILM LAYERED STRUCTURES

Krauss R. A., Rangaswamy M., Lin Y., Gruen M. D., Schultz A. J., Schmidt K. H., Chang H. P. R.

Kluwer Academic Publishers
6 Conference Proceedings Characterization of thin metal oxide films grown by atomic layer deposition

Evans, P.J., Prince, K., Triani, G., Finnie, K.S., Mitchell, D.R.G., Barbe, C.J.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Growth and Characterization of Ga2Te5and its Solid-Solution

Singh, D.P., Suri, D.K., Sood, K.N.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12