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Raman, X-ray Diffraction, and Photemission Measurements on C60 and Doped C60 Films

Author(s):
Publication title:
Frontiers of high pressure research II: application of high pressure to low-dimensional novel electronic materials
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
48
Pub. Year:
2001
Page(from):
493
Page(to):
506
Pages:
14
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISBN:
9781402001598 [1402001592]
Language:
English
Call no.:
N17050/48
Type:
Conference Proceedings

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