Application of the electro-mechanical impedance method for the identification of in-situ stress in structures
- Author(s):
- ong, C.W. ( Nanyang Technological Univ. (Singapore) )
- Yang, Y.
- naidu, A.S.K.
- Lum Y.
- Soh, C.K.
- Publication title:
- Smart structures, devices, and systems : 16-18 December 2002 Melbourne, Australia
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4935
- Pub. Year:
- 2002
- Page(from):
- 503
- Page(to):
- 514
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447302 [0819447307]
- Language:
- English
- Call no.:
- P63600/4935
- Type:
- Conference Proceedings
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