Reliability of the 1st Level and the 2nd Level Inteconnections on the Flip Chip PBGA Package
- Author(s):
- Ahn, Eun-Chul ( Samsung Electronics Co., Ltd. )
- Lee, Young-Min
- Ryu, Ju-Hyun
- Chung, Tae-Gyeong
- Oh, Se-Yong
- Publication title:
- Proceedings : 2002 International Symposium on Microelectronics : September 4-6, 2002, Colorado Convention Center, Denver, CO
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4931
- Pub. Year:
- 2002
- Page(from):
- 839
- Page(to):
- 844
- Pages:
- 6
- Pub. info.:
- Washington, DC: IMAPS
- ISSN:
- 0277786X
- ISBN:
- 9780930815660 [0930815661]
- Language:
- English
- Call no.:
- P63600/4931
- Type:
- Conference Proceedings
Similar Items:
IMAPS |
7
Conference Proceedings
Time-Resolved Photoluminescence Measurements of In0.15Ga0.85N/In0.015Ga0.985N Quantum Wells with Si-doped Barriers
Materials Research Society |
2
Conference Proceedings
ZrO₂-supported Pt Catalysts for Water Gas Shift Reaction and Their Non-Pyrophoric Property
Elsevier |
Elsevier |
Materials Research Society |
American Institute of Chemical Engineers |
IMAPS |
10
Conference Proceedings
Width and Gap Dependent Performance of Ferroelectric Coplanar Waveguide Phase Shifter Based on (Ba,Sr)TiO3 Thin Films
Materials Research Society |
The American Society of Mechanical Engineers |
Materials Research Society |
6
Conference Proceedings
MICROWAVE FREQUENCY MODEL OF FLIP-CHIP INTERCON-NECTS USING ANISOTROPIC CONDUCTIVE FILM
IMAPS |
12
Conference Proceedings
Fine Pitch 2nd Bond Evaluation for PBGA Packages : Process Capability and Reliability Assessments
IMAPS |