Real-time far distance microvibration measurement using an external cavity semiconductor laser interferometer with a feedback control system

Real-time far distance microvibration measurement using an external cavity semiconductor laser interferometer with a feedback control system

Author(s):

Zhao, W.R. ( Institute of Semiconductors (China) )
Jiang, P.F.
Xie, F.Z.

Publication title:

Optical design and testing : 15-18 October 2002, Shanghai, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4927

Pub. Year:

2002

Page(from):

770

Page(to):

774

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447166 [0819447161]

Language:

English

Call no.:

P63600/4927

Type:

Conference Proceedings

Details

TDL ID:	ZA00012776
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Optical Design and Testing
Conf. info. (Number):	2002
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2002.10.15-2002.10.18

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