Blank Cover Image

Theory and error analysis of 3D measure system of structural light

Author(s):
Publication title:
Optical design and testing : 15-18 October 2002, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4927
Pub. Year:
2002
Page(from):
733
Page(to):
737
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447166 [0819447161]
Language:
English
Call no.:
P63600/4927
Type:
Conference Proceedings

Similar Items:

Qiao, Y.J., Yu, X.Y., Zhao, J., Wang, Y.J.

SPIE-The International Society for Optical Engineering

Y.G. Shi, X.Y. Zhao, L.Q. Zeng, H.Y. Wang, D.W. Zhang

Trans Tech Publications

L. Wang, X. Meng, Z. Lv

Society of Photo-optical Instrumentation Engineers

X.Y. Lu, B.H. Wu, Y.J. Liu, T. Qiu, W. Jie

Trans Tech Publications

J. Zhao, D. Wang, Z. Zhou, Y. Wan, Z. Jiang

Society of Photo-optical Instrumentation Engineers

Zhang, X.Y., Yu, F.X., Yang, K.S., Chen, G., Wang, W.H., Sun, H.Z., Lu, L.P., Wang, Z.J.

SPIE-The International Society for Optical Engineering

X.Y. Qiao, R.J. Wang

Trans Tech Publications

Z.P. Ma, X.Y. Zhao, F.J. Wang, D.W. Zhang

Trans Tech Publications

Lu, H., Zhao, Y.J., Liu, X.H., Liu, M.Q., Zhou, Y.B., Yu, F., Sun, Y.

SPIE-The International Society for Optical Engineering

He,B., Zhao,X., Qiao,S.

SPIE-The International Society for Optical Engineering

Yu, F., Liu, M., Zhao, Y.J., Liu, X.H., Lu, H., Sun, Y., Zhou, Y.B.

SPIE-The International Society for Optical Engineering

Li Q.-A., Li X.-R, Liang C.-P., Qiao Y.-F.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12