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Multiwavelength high-thermometry using spectrum analysis

Author(s):
Qi, X.M. ( Nanchang Institute of Aeronautical Technology (China) )
Gao, Y.Q.
Chen, H.M.
Yuan, L.H.
Zhu, X.J.
Xing, J.
1 more
Publication title:
Optical design and testing : 15-18 October 2002, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4927
Pub. Year:
2002
Page(from):
329
Page(to):
332
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447166 [0819447161]
Language:
English
Call no.:
P63600/4927
Type:
Conference Proceedings

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