Improvement and application of scanning near-field optical microscope based on a piezoelectric bimorph shear force beam

Improvement and application of scanning near-field optical microscope based on a piezoelectric bimorph shear force beam

Author(s):

Chen, T. ( Tsinghua Univ. (China) )

Publication title:

Nano-Optics and Nano-Structures

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4923

Pub. Year:

2002

Page(from):

31

Page(to):

35

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447128 [0819447129]

Language:

English

Call no.:

P63600/4923

Type:

Conference Proceedings

Details

TDL ID:	ZA00012772
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Nano-optics and nano-structures
Conf. info. (Number):	2002
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2002.10.15-2002.10.16

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