Wavelength accuracy in spectrophotometer based on linear arrays

Wavelength accuracy in spectrophotometer based on linear arrays

Author(s):

Hu, W.J. ( Beijing Institute of Technology (China) )
Zhu, Z.F.

Publication title:

Color science and imaging technologies : 16-17 October, 2002, Shanghai, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4922

Pub. Year:

2002

Page(from):

180

Page(to):

187

Pages:

8

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447111 [0819447110]

Language:

English

Call no.:

P63600/4922

Type:

Conference Proceedings

Details

TDL ID:	ZA00012771
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Color science and imaging technologies
Conf. info. (Number):	2002
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2002.10.16-2002.10.17

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