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Probe design for measuring high-reflective surface

Author(s):
Publication title:
Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4920
Pub. Year:
2002
Page(from):
433
Page(to):
436
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447098 [0819447099]
Language:
English
Call no.:
P63600/4920
Type:
Conference Proceedings

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