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Rapidly measuring temperature and software optimization used in infrared thermography during laser repairing cracks processing

Author(s):
Wang, Z.K. ( Huazhong Univ. of Science and Technology (China) )
Ye, H.Q.
Zhang, H.L.
Lei, J.P.
Zeng, X.Y.
Huang, S.Y.
Shu, X.F.
2 more
Publication title:
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4919
Pub. Year:
2002
Page(from):
298
Page(to):
300
Pages:
3
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447081 [0819447080]
Language:
English
Call no.:
P63600/4919
Type:
Conference Proceedings

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