Analysis of frequency response of electronic circuit in OMA
- Author(s):
- Chen, J.W. ( China Institute of Metrology and Zhejiang Univ. (China) )
- Wang, W. ( China Institute of Metrology )
- Chen, A.
- Li, Z.N. ( Zhejiang Univ. (China) )
- Publication title:
- Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4919
- Pub. Year:
- 2002
- Page(from):
- 144
- Page(to):
- 148
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447081 [0819447080]
- Language:
- English
- Call no.:
- P63600/4919
- Type:
- Conference Proceedings
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