Blank Cover Image

Deformation-phase measurement of difuse objects using two laser beams of different wavelengths

Author(s):
Publication title:
Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4902
Pub. Year:
2002
Page(from):
608
Page(to):
615
Pages:
8
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446893 [0819446890]
Language:
English
Call no.:
P63600/4902
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Vertical-scanning profilometry using double-exposure camera and two short-coherent light sources of different wavelengths

Adachi, M., Inabe, K.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Form measurement of small cylindrical objects using two-wavelength interferometry

A. Höink, K. Meiners-Hagen, O. Jusko, A. Abou-Zeid

Society of Photo-optical Instrumentation Engineers
2 Conference Proceedings Proposing a novel scheme for optical manipulation of objects using interference of two laser beams of different wavelengths

S. Maruyama, T. Tagami, H. Okamura

Society of Photo-optical Instrumentation Engineers
8 Conference Proceedings Step-height measurement with a two-wavelength laser diode interferometer using time-sharing sinusoidal phase modulation

Suzuki,T., Yazawa,T., Sasaki,O.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Dynamic phase measurement of large deformation with speckle intererometry

Matsumoto, T., Kitagawa, Y., Adachi, M.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Deformation analysis on micro objects using multiple wavelength microscopic TV holography

U. P. Kumar, N. K. Mohan, M. P. Kothiyal, A. K. Asundi

Society of Photo-optical Instrumentation Engineers
4 Conference Proceedings Interferometric deformation measurement using object-induced dynamic phase-shifting

Lega,X.Colonna de, Jacquot,P.M.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Measurement of absolute object deformations by means of two-wavelength electronic speckle pattern interferometry (ESPI)

H. Kreitlow, J. Miesner, J. Stockmann

Society of Photo-optical Instrumentation Engineers
5 Conference Proceedings Two-wavelength contouring for shape and deformation measurement

Dale,M., Buckberry,C.H., Towers,D.P.

SPIE - The International Society for Optical Engineering
11 Conference Proceedings Use of ring laser units for measurement of moving object deformations

Mochalov, A.V., Kazantsev, A.V.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings In vitro glucose measurements using a two-wavelength CO2 laser

Lademann, J., Richter, H., Meinke, M., Mueller, G.J., Kapustin, P., Masychev, V.I., Bulkin, Y.N., Berndt, K.W., Sterry, …

SPIE-The International Society for Optical Engineering
12 Conference Proceedings High-speed precision surface profilometry using large phase shifting

Adachi, M., Ueda, K.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12