Progress with the implementation of a shearography system for the testing of technical components

Progress with the implementation of a shearography system for the testing of technical components

Author(s):

Osten, W. ( Bremer Institut fuer Angewandte Strahltechnik (Germany) )
Baumbach, T.
Falldorf, C.
Kalms, M.K.
Jueptner, W.P.

Publication title:

Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4900

Pub. Year:

2002

Vol.:

Part Two

Page(from):

1299

Page(to):

1309

Pages:

11

Pub. info.:

SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446862 [0819446866]

Language:

English

Call no.:

P63600/4900

Type:

Conference Proceedings

Details

TDL ID:	ZA00012750
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Conf. info. (Number):	2002 : 7th
Conf. info. (Venue):	Novosibirsk, Russia
Conf. info. (Date):	2002.09.09-2002.09.13

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