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Robust contour model for matching synthetic aperture radar (SAR) images with maps

Author(s):
Publication title:
Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4898
Pub. Year:
2003
Page(from):
150
Page(to):
161
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446848 [081944684X]
Language:
English
Call no.:
P63600/4898
Type:
Conference Proceedings

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