Defect printability analysis on alternating phase-shifting masks for 193-nm lithography
- Author(s):
Morikawa, Y. ( Dai Nippon Printing Co., Ltd. (Japan) ) Totsu, Y. Nishiguchi, M. Hoga, M. Hayashi, N. Pang, L. ( Numeical Technologies, Inc. (USA) ) Luk-Pat, G.T. - Publication title:
- 22nd Annual BACUS Symposium on Photomask Technology
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4889
- Pub. Year:
- 2002
- Vol.:
- Part Two
- Page(from):
- 922
- Page(to):
- 934
- Pages:
- 13
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819446756 [0819446750]
- Language:
- English
- Call no.:
- P63600/4889
- Type:
- Conference Proceedings
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