Blank Cover Image

Dome degradation pattern of the ERBE wide-field-of-view shortwave radiometer

Author(s):
  • Smith, G.L. ( Virginia Polytechnic Institute and State Univ. (USA) )
  • Lee, R.B. ( NASA Langley Research Ctr. (USA) )
  • Paden, J. ( Sience Application International Corp. (USA) )
Publication title:
Sensors, systems, and next-generation satellites VI : 23-26 September 2002, Agia Pelagia, Crete, Greece
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4881
Pub. Year:
2003
Page(from):
369
Page(to):
377
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446633 [0819446637]
Language:
English
Call no.:
P63600/4881
Type:
Conference Proceedings

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