Line feature extraction and matching in palmprint

Line feature extraction and matching in palmprint

Author(s):

Wu, X.Q. ( Harbin Institute of Technology (China) )
Wang, K.Q.
Zhang, D. ( Hong Kong Polytechnic Univ. )

Publication title:

Second International Conference on Image and Graphics

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4875

Pub. Year:

2002

Vol.:

Part One

Page(from):

583

Page(to):

590

Pages:

8

Pub. info.:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446565 [0819446564]

Language:

English

Call no.:

P63600/4875

Type:

Conference Proceedings

Details

TDL ID:	ZA00012720
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Image and Graphics
Conf. info. (Number):	2002 : 2nd
Conf. info. (Venue):	Hefei, China
Conf. info. (Date):	2002.08.16-2002.08.18

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