Wide-field imaging interferometry testbed 3: metrology subsystem

Wide-field imaging interferometry testbed 3: metrology subsystem

Author(s):

Leviton, D.B. ( NASA Goddard Space Flight Ctr.(USA) )

Mundy, L.G. ( Univ. of Maryland/College Park(USA) )

Rinehart, S.A. ( National Research Council(USA) )

Teng, S.H. ( Univ. of Maryland/College Park(USA) )

Zhang, X. ( Science Systems and Applications, Inc.(USA) )

4 more

Publication title:

Interferometry in Space

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4852

Pub. Year:

2003

Vol.:

Part Two

Page(from):

827

Page(to):

838

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446312 [0819446319]

Language:

English

Call no.:

P63600/4852

Type:

Conference Proceedings

Details

TDL ID:	ZA00012697
Series ID:	PA00000029
Conf. info. (Name):	Astronomical Telescopes and Instrumentation : Interferometry in Space
Conf. info. (Number):	2002
Conf. info. (Venue):	Waikoloa, HI, USA
Conf. info. (Date):	2002.08.26-2002.08.28

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